contributor author | J. A. Bailey | |
contributor author | S. E. Becker | |
date accessioned | 2017-05-09T01:38:12Z | |
date available | 2017-05-09T01:38:12Z | |
date copyright | July, 1974 | |
date issued | 1974 | |
identifier issn | 0094-4289 | |
identifier other | JEMTA8-26837#163_1.pdf | |
identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/164802 | |
description abstract | The effect of cutting speed and wear land length on the phenomenon of microchip formation during machining of quenched and tempered AISI 4340 steel under dry orthogonal conditions is determined. Machined test pieces are examined using scanning electron and optical microscopy. Surface roughness is determined using a profilometer. A possible mechanism of microchip formation based on the interaction between the surfaces of the tool and freshly machined work piece is discussed. It is suggested that the grooves left by the generation of microchips may act as sources for the initiation of failures by creep, fatigue and stress corrosion cracking. It is also suggested that the results obtained using scanning electron microscopy may be more indicative of the true surface condition than surface roughness measurements. | |
publisher | The American Society of Mechanical Engineers (ASME) | |
title | On Microchip Formation During Machining of a High Strength Steel | |
type | Journal Paper | |
journal volume | 96 | |
journal issue | 3 | |
journal title | Journal of Engineering Materials and Technology | |
identifier doi | 10.1115/1.3443205 | |
journal fristpage | 163 | |
journal lastpage | 167 | |
identifier eissn | 1528-8889 | |
keywords | Machining | |
keywords | High strength steel | |
keywords | Integrated circuits | |
keywords | Surface roughness | |
keywords | Scanning electron microscopy | |
keywords | Cutting | |
keywords | Failure | |
keywords | Optical microscopy | |
keywords | Mechanisms | |
keywords | Stress corrosion cracking | |
keywords | Steel | |
keywords | Measurement | |
keywords | Creep | |
keywords | Fatigue | |
keywords | Wear AND Electrons | |
tree | Journal of Engineering Materials and Technology:;1974:;volume( 096 ):;issue: 003 | |
contenttype | Fulltext | |