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contributor authorMao, Yijin
contributor authorZhang, Yuwen
contributor authorChen, J. K.
date accessioned2017-05-09T01:00:15Z
date available2017-05-09T01:00:15Z
date issued2013
identifier issn1087-1357
identifier othermanu_135_2_021007.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/152304
description abstractMelting, vaporization, and resolidification in a gold thin film subject to multiple femtosecond laser pulses are numerically studied in the framework of the twotemperature model. The solidliquid phase change is modeled using a kinetics controlled model that allows the interfacial temperature to deviate from the melting point. The kinetics controlled model also allows superheating in the solid phase during melting and undercooling in the liquid phase during resolidification. Superheating of the liquid phase caused by nonequilibrium evaporation of the liquid phase is modeled by adopting the wave hypothesis, instead of the Clausius–Clapeyron equation. The melting depth, ablation depth, and maximum temperature in both the liquid and solid are investigated and the result is compared with that from the Clausius–Clapeyron equation based vaporization model. The vaporization wave model predicts a much higher vaporization speed, which leads to a deeper ablation depth. The relationship between laser processing parameters, including pulse separation time and pulse number, and the phase change effect are also studied. It is found that a longer separation time and larger pulse number will cause lower maximum temperature within the gold film and lower depths of melting and ablation.
publisherThe American Society of Mechanical Engineers (ASME)
titleMelting, Vaporization, and Resolidification in a Thin Gold Film Irradiated by Multiple Femtosecond Laser Pulses
typeJournal Paper
journal volume135
journal issue2
journal titleJournal of Manufacturing Science and Engineering
identifier doi10.1115/1.4023711
journal fristpage21007
journal lastpage21007
identifier eissn1528-8935
treeJournal of Manufacturing Science and Engineering:;2013:;volume( 135 ):;issue: 002
contenttypeFulltext


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