| contributor author | K. Hattar | |
| contributor author | A. Misra | |
| contributor author | M. R. F. Dosanjh | |
| contributor author | P. Dickerson | |
| contributor author | I. M. Robertson | |
| contributor author | R. G. Hoagland | |
| date accessioned | 2017-05-09T00:50:51Z | |
| date available | 2017-05-09T00:50:51Z | |
| date copyright | April, 2012 | |
| date issued | 2012 | |
| identifier issn | 0094-4289 | |
| identifier other | JEMTA8-27153#021014_1.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/148999 | |
| description abstract | The failure of a cross-sectional 65 nm-thick copper and 150 nm-thick niobium multilayer thin film was investigated via an in situ transmission electron microscopy straining experiment. The fracture of the free-standing multilayer films was associated with confined dislocation slip within layers containing and preceding the crack tip. Four crack hindrance mechanisms were observed to operate during crack propagation: microvoid formation, crack deviation, layer necking, and crack blunting. Failure was observed to occur across and through the copper and niobium layers but never within the interfaces or grain boundaries. These results are discussed relative to the length-scale-dependent deformation mechanisms of nanoscale metallic multilayers. | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Direct Observation of Crack Propagation in Copper–Niobium Multilayers | |
| type | Journal Paper | |
| journal volume | 134 | |
| journal issue | 2 | |
| journal title | Journal of Engineering Materials and Technology | |
| identifier doi | 10.1115/1.4005953 | |
| journal fristpage | 21014 | |
| identifier eissn | 1528-8889 | |
| keywords | Deformation | |
| keywords | Copper | |
| keywords | Fracture (Process) | |
| keywords | Crack propagation | |
| keywords | Dislocations | |
| keywords | Failure | |
| keywords | Necking | |
| keywords | Mechanisms | |
| keywords | Grain boundaries | |
| keywords | Fracture (Materials) | |
| keywords | Thin films | |
| keywords | Nanoscale phenomena | |
| keywords | Transmission electron microscopy | |
| keywords | Thickness AND Stress | |
| tree | Journal of Engineering Materials and Technology:;2012:;volume( 134 ):;issue: 002 | |
| contenttype | Fulltext | |
