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contributor authorYongqing Li
contributor authorJun Ni
date accessioned2017-05-09T00:45:35Z
date available2017-05-09T00:45:35Z
date copyrightFebruary, 2011
date issued2011
identifier issn1087-1357
identifier otherJMSEFK-28429#011014_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/146936
description abstractModern manufacturing requires close monitoring by correlating finer frequency regimes of the surface texture to process parameters. This paper presents a study of B-spline wavelet-based multiresolution analysis (MRA) for surface texture characterization and process parameter correlation in end-milling. Motivated by multiresolution curves in computer graphics, an initial B-spline surface is first interpolated to the measured points of the surface texture. With a B-spline wavelet transform, the initial surface is decomposed into higher-frequency details and lower-frequency approximations. By taking the reconstructed surface roughness, waviness, and form based on different frequency regimes as the responses, regression models are created by considering the feed rate, spindle speed, axial depth of cut, and tool wear as controllable variables. The case studies and comparisons with an International Organization for Standardization (ISO) Gaussian filter have demonstrated the effectiveness of the proposed B-spline wavelet-based MRA algorithm for a surface texture analysis and manufacturing process diagnostics.
publisherThe American Society of Mechanical Engineers (ASME)
titleB-Spline Wavelet-Based Multiresolution Analysis of Surface Texture in End-Milling of Aluminum
typeJournal Paper
journal volume133
journal issue1
journal titleJournal of Manufacturing Science and Engineering
identifier doi10.1115/1.4002452
journal fristpage11014
identifier eissn1528-8935
keywordsMilling
keywordsSurface texture
keywordsWavelets
keywordsB-splines
keywordsSurface roughness
keywordsApproximation
keywordsAlgorithms AND Wear
treeJournal of Manufacturing Science and Engineering:;2011:;volume( 133 ):;issue: 001
contenttypeFulltext


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