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contributor authorPatrick E. Hopkins
contributor authorPamela M. Norris
date accessioned2017-05-09T00:33:56Z
date available2017-05-09T00:33:56Z
date copyrightFebruary, 2009
date issued2009
identifier issn0022-1481
identifier otherJHTRAO-27855#022402_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/141127
description abstractThe accuracy of predictions of phonon thermal boundary conductance using traditional models such as the diffuse mismatch model (DMM) varies depending on the types of material comprising the interface. The DMM assumes that phonons, undergoing diffuse scattering events, are elastically scattered, which drives the energy conductance across the interface. It has been shown that at relatively high temperatures (i.e., above the Debye temperature) previously ignored inelastic scattering events can contribute substantially to interfacial transport. In this case, the predictions from the DMM become highly inaccurate. In this paper, the effects of inelastic scattering on thermal boundary conductance at metal/dielectric interfaces are studied. Experimental transient thermoreflectance data showing inelastic trends are reviewed and compared to traditional models. Using the physical assumptions in the traditional models and experimental data, the relative contributions of inelastic and elastic scattering to thermal boundary conductance are inferred.
publisherThe American Society of Mechanical Engineers (ASME)
titleRelative Contributions of Inelastic and Elastic Diffuse Phonon Scattering to Thermal Boundary Conductance Across Solid Interfaces
typeJournal Paper
journal volume131
journal issue2
journal titleJournal of Heat Transfer
identifier doi10.1115/1.2995623
journal fristpage22402
identifier eissn1528-8943
keywordsPhonons
keywordsRadiation scattering
keywordsElectromagnetic scattering
keywordsElectrical conductance
keywordsTemperature AND Elastic scattering
treeJournal of Heat Transfer:;2009:;volume( 131 ):;issue: 002
contenttypeFulltext


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