Materials Processing Defects

Abstract

The papers in this special edition came from lectures delivered at the Fifth International Conference on Materials Processing Defects (MPD-5) held at Cornell University July 18–20, 2007 at Cornell University in Ithaca, New York. The previous four MPD conferences were held in France and Germany with the aim of providing a timely forum for the presentation and discussion of cutting-edge approaches to the issues confronting researchers in understanding the occurrence of materials processing defects. While the historical focus of the MPD conferences has been on advanced simulation methods for predicting and preventing the occurrence of defects in manufactured products, MPD-5 also highlighted progress in understanding the micromechanical origins of defects and in quantifying the influence of defects on the success of the process and the integrity of the product. Sessions included presentations covering methods that employ experiments, simulations, and combinations of the two, to reach improved characterization of defect initiation and growth. Contributions to the conference introduced emerging experimental and simulation technologies, including high-energy x-ray scattering and computational environments for multiscale modeling. The scope of processing was also expanded to include issues surrounding the occurrence of defects in the fabrication of MEMS devices.