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contributor authorScott Bair
contributor authorYuchuan Liu
contributor authorQ. Jane Wang
date accessioned2017-05-09T00:21:41Z
date available2017-05-09T00:21:41Z
date copyrightJuly, 2006
date issued2006
identifier issn0742-4787
identifier otherJOTRE9-28741#624_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/134715
description abstractThere has been a long-standing need for a piezoviscous parameter αfilm that, together with the ambient viscosity μ0, will completely quantify the Newtonian rheology so that the film thickness for liquids that do not shear-thin in the inlet may be calculated as h=h(μ0,αfilm,…), regardless of the details of the pressure-viscosity response. It seems that Blok’s reciprocal asymptotic isoviscous pressure has certain advantages over the conventional pressure-viscosity coefficient, which is poorly suited for this purpose. The first detailed review of piezoviscous models for low pressures is provided. A simulation code that is apparently stable for all realistic pressure-viscosity response was utilized with diverse piezoviscous models and model liquids to develop a satisfactory definition of αfilm that reads αfilm=[1−exp(−3)]∕[∫03∕α*μ(0)dp∕μ(p)]; 1∕α*=∫0∞μ(0)dp∕μ(p). In the case of μ=μ0exp(αp),αfilm=α and formulas are provided for other models.
publisherThe American Society of Mechanical Engineers (ASME)
titleThe Pressure-Viscosity Coefficient for Newtonian EHL Film Thickness With General Piezoviscous Response
typeJournal Paper
journal volume128
journal issue3
journal titleJournal of Tribology
identifier doi10.1115/1.2197846
journal fristpage624
journal lastpage631
identifier eissn1528-8897
keywordsPressure
keywordsViscosity AND Film thickness
treeJournal of Tribology:;2006:;volume( 128 ):;issue: 003
contenttypeFulltext


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