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contributor authorXiaopeng Zhao
contributor authorHarry Dankowicz
date accessioned2017-05-09T00:19:07Z
date available2017-05-09T00:19:07Z
date copyrightApril, 2006
date issued2006
identifier issn1555-1415
identifier otherJCNDDM-25539#109_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/133276
description abstractTapping-mode atomic force microscopy has wide applications for probing the nanoscale surface and subsurface properties of a variety of materials in a variety of environments. Strongly nonlinear effects due to large variations in the force field on the probe tip over very small length scales and the intermittency of contact with the sample, however, result in strong dynamical instabilities. These can result in a sudden loss of stability of low-contact-velocity oscillations of the atomic-force-microscope tip in favor of oscillations with high contact velocity, coexistence of stable oscillatory motions, and destructive, nonrepeatable, and unreliable characterization of the nanostructure. In this paper, dynamical systems tools for piecewise-smooth systems are employed to characterize the loss of stability and associated parameter-hysteresis phenomena.
publisherThe American Society of Mechanical Engineers (ASME)
titleCharacterization of Intermittent Contact in Tapping-Mode Atomic Force Microscopy
typeJournal Paper
journal volume1
journal issue2
journal titleJournal of Computational and Nonlinear Dynamics
identifier doi10.1115/1.2162864
journal fristpage109
journal lastpage115
identifier eissn1555-1423
keywordsOscillations
keywordsForce
keywordsStability
keywordsAtomic force microscopy
keywordsMotion
keywordsDynamic systems
keywordsBifurcation
keywordsCantilevers
keywordsTrajectories (Physics)
keywordsDynamics (Mechanics) AND Separation (Technology)
treeJournal of Computational and Nonlinear Dynamics:;2006:;volume( 001 ):;issue: 002
contenttypeFulltext


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