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contributor authorKenji Fukuzawa
contributor authorAkira Nakada
contributor authorYasunaga Mitsuya
contributor authorHedong Zhang
date accessioned2017-05-09T00:14:27Z
date available2017-05-09T00:14:27Z
date copyrightOctober, 2004
date issued2004
identifier issn0742-4787
identifier otherJOTRE9-28727#755_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/130839
description abstractWe demonstrated the direct visualization of molecularly thin lubricant films on magnetic disks with a thickness resolution of 0.1 nm by using an ellipsometric microscope with a white light source. It was able to reduce the optical interference noise that arises in conventional laser-based ellipsometric microscopes and to provide a larger SNR by a factor of about 6 compared to a laser-based ellipsometric microscope. The wavelength width should be given first priority in designing a white-light-source ellipsometric microscope, and the width should be determined after considering the required coherence length and thickness resolution. Theoretical calculations indicate that a wavelength width of less than 10 nm can provide a thickness resolution of 0.1 nm. A white-light-source ellipsometric microscope can provide real-time visualization of a molecularly thin lubricant film with a thickness resolution of 0.1 nm, which is useful in investigating the kinetic behavior of molecularly thin lubricant films on magnetic disks.
publisherThe American Society of Mechanical Engineers (ASME)
titleDirect Visualization of Molecularly Thin Lubricant Films on Magnetic Disks by Ellipsometric Microscopy With a White Light Source
typeJournal Paper
journal volume126
journal issue4
journal titleJournal of Tribology
identifier doi10.1115/1.1792694
journal fristpage755
journal lastpage760
identifier eissn1528-8897
treeJournal of Tribology:;2004:;volume( 126 ):;issue: 004
contenttypeFulltext


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