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contributor authorJoseph J. Eppert
contributor authorGraduate Research Assistant
contributor authorN. Rajagopalan
contributor authorSenior Research Engineer
contributor authorRichard E. DeVor
contributor authorShiv G. Kapoor
date accessioned2017-05-09T00:10:40Z
date available2017-05-09T00:10:40Z
date copyrightNovember, 2003
date issued2003
identifier issn1087-1357
identifier otherJMSEFK-27779#703_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/128663
description abstractCertain components found in metalworking fluid formulations are known to be prone to selective depletion via adsorption onto the surfaces of particulate generated during metal cutting operations. The characteristics of adsorption for a multi-component synthetic metalworking fluid are investigated in order to determine the affect that machining particulate contamination has on component depletion from this fluid. Experimental measurements indicate that the corrosion inhibiting component of the formulation is especially prone to depletion via the adsorption mechanism. A Langmuir isotherm/mass balance based predictive model is developed to determine the effect of chip adsorption on depletion from industrial metalworking fluid systems and is experimentally verified. An industrial case study is applied to further investigate selective component depletion via the adsorption mechanism.
publisherThe American Society of Mechanical Engineers (ASME)
titleThe Effect of Chip Adsorption on Selective Depletion From a Multi-Component Synthetic Metalworking Fluid
typeJournal Paper
journal volume125
journal issue4
journal titleJournal of Manufacturing Science and Engineering
identifier doi10.1115/1.1615794
journal fristpage703
journal lastpage708
identifier eissn1528-8935
keywordsFluids
keywordsMetalworking
keywordsMachining
keywordsEquilibrium (Physics)
keywordsMetal surfaces
keywordsCorrosion
keywordsMaintenance
keywordsMechanisms
keywordsParticulate matter
keywordsModeling
keywordsMeasurement AND Lubricants
treeJournal of Manufacturing Science and Engineering:;2003:;volume( 125 ):;issue: 004
contenttypeFulltext


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