contributor author | Yuh J. Chao | |
date accessioned | 2017-05-09T00:10:22Z | |
date available | 2017-05-09T00:10:22Z | |
date copyright | April, 2003 | |
date issued | 2003 | |
identifier issn | 0094-4289 | |
identifier other | JEMTA8-27045#125_1.pdf | |
identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/128492 | |
description abstract | Strength tests were performed to reveal the failure mechanisms of spot weld in lap-shear and cross tension test samples. It is shown the while the lap-shear (cross tension) sample is subjected to shear (normal) load at the structural level the failure mechanism at the spot weld is tensile (shear) mode at the materials level. Based on the observed failure mechanism, stress distribution is assumed and related to the far field load for the lap-shear and cross tension test samples. It appears that the failure load of the cross tension sample is 74 percent of the lap-shear sample based on the classical von Mises failure theory. The theoretical model is further extended to the mixed normal/shear loading condition. Data from strength tests as well as finite element numerical method are used to validate the model. Finally, the utility of the model in accessing the failure strength of spot welds is discussed. | |
publisher | The American Society of Mechanical Engineers (ASME) | |
title | Ultimate Strength and Failure Mechanism of Resistance Spot Weld Subjected to Tensile, Shear, or Combined Tensile/Shear Loads | |
type | Journal Paper | |
journal volume | 125 | |
journal issue | 2 | |
journal title | Journal of Engineering Materials and Technology | |
identifier doi | 10.1115/1.1555648 | |
journal fristpage | 125 | |
journal lastpage | 132 | |
identifier eissn | 1528-8889 | |
keywords | Stress | |
keywords | Shear (Mechanics) | |
keywords | Failure mechanisms | |
keywords | Failure | |
keywords | Tensile strength | |
keywords | Tension | |
keywords | Fracture (Process) AND Welding | |
tree | Journal of Engineering Materials and Technology:;2003:;volume( 125 ):;issue: 002 | |
contenttype | Fulltext | |