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contributor authorJ. M. Lee
contributor authorK. G. Watkins
contributor authorW. M. Steen
date accessioned2017-05-09T00:05:24Z
date available2017-05-09T00:05:24Z
date copyrightAugust, 2001
date issued2001
identifier issn1087-1357
identifier otherJMSEFK-27501#521_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/125525
description abstractThe laser cleaning of copper surfaces with a Nd:YAG Q-switched laser pulse for the improvement of solder quality on printed circuit boards (PCBs) has been monitored and characterized by sensing the acoustic emission during the process and one-dimensional mathematical model analysis. It was found that selective removal of copper oxides from the surface was achieved by the laser operation, which was described theoretically by the model and was confirmed experimentally by the acoustic monitoring. The acoustic monitoring provided not only threshold laser fluence and optimal process window for the cleaning of copper but also the clear possibility for real-time surface monitoring of the process. Different features at the two laser wavelengths used (1064 nm and 532 nm) were observed in the surface morphology, i.e., the laser pulse with 532 nm wavelength produced a lightly sputtered wide area around the laser crater. From the theoretical and experimental investigation of laser cleaning mechanisms at different wavelengths, it was found that the mechanical effect induced by the intense shock waves was much more dominant at 532 nm wavelength than at 1064 nm.
publisherThe American Society of Mechanical Engineers (ASME)
titleCharacterization of Laser Cleaning of Copper for Soldering Processes
typeJournal Paper
journal volume123
journal issue3
journal titleJournal of Manufacturing Science and Engineering
identifier doi10.1115/1.1344897
journal fristpage521
journal lastpage527
identifier eissn1528-8935
keywordsCopper
keywordsLasers
keywordsWavelength
keywordsAcoustics AND Mechanisms
treeJournal of Manufacturing Science and Engineering:;2001:;volume( 123 ):;issue: 003
contenttypeFulltext


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