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contributor authorPsang Dain Lin
contributor authorTe-tan Liao
contributor authorGraduate student
date accessioned2017-05-09T00:02:55Z
date available2017-05-09T00:02:55Z
date copyrightMay, 2000
date issued2000
identifier issn1087-1357
identifier otherJMSEFK-27403#338_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/123997
description abstractIn order to improve upon the inconvenient and complicated contemporary analytic techniques employed for optical systems, this paper investigates two important optical topics: (1) the determination of light ray paths and (2) sensitivity analysis of light path parameters with respect to the light source location for occasions when light rays cross medium boundary surfaces. To this end, the traditional laws of reflection and refraction are reformulated in terms of revolution geometry. This results in a set of laws much simpler than the original, suitable for use in mathematical modeling to determine light paths and system sensitivity from location of the light source, optical component location, the equation of the optical component’s surface curve, and the refractive index. Ray tracing and sensitivity analysis of the two most popular boundary surfaces, flat and spherical, are presented as examples. In order to illustrate experimentally the integration of these boundary surfaces into optical systems, an optical measurement system for measuring surface height and orientation, containing a beam splitter and a bi-convex lens, was built. Agreement between the experimental optical system’s performance and the theoretical predictions yielded by the proposed method are excellent. [S1087-1357(00)01501-X]
publisherThe American Society of Mechanical Engineers (ASME)
titleSkew Ray Tracing and Sensitivity Analysis of Geometrical Optics
typeJournal Paper
journal volume122
journal issue2
journal titleJournal of Manufacturing Science and Engineering
identifier doi10.1115/1.538924
journal fristpage338
journal lastpage349
identifier eissn1528-8935
keywordsRefraction
keywordsLenses (Optics)
keywordsReflection
keywordsEquations
keywordsRay tracing
keywordsSensitivity analysis
keywordsOptics
keywordsLight sources
keywordsModeling
keywordsRefractive index
keywordsGeometry AND Structural frames
treeJournal of Manufacturing Science and Engineering:;2000:;volume( 122 ):;issue: 002
contenttypeFulltext


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