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contributor authorC. W. Wang
contributor authorA. M. Sastry
date accessioned2017-05-09T00:02:32Z
date available2017-05-09T00:02:32Z
date copyrightOctober, 2000
date issued2000
identifier issn0094-4289
identifier otherJEMTA8-27013#460_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/123747
description abstractApplications for porous fibrous materials range from electrochemical substrates to web reinforcement in polymeric composite materials. The details of local load transfer are studied in a class of cost-effective, stochastic fibrous networks used in battery applications. The connectivity of these materials is quantitatively related to modulus and strength, and detailed results of different simulations approaches in approximating material construction are discussed. In Part II, we focus on the consequences of various microscale assumptions concerning bonding, beam type, failure mode and simulation scale on effective moduli and peak loads. We show that the effects of scale are important even in a tight range of window sizes (one-tenth to ten times the staple length), especially as compared to the relative insensitivity of conductivity to scale, when only bulk conduction is considered. We also discuss issues of connectivity at the scale of the porous material rather than element-by-element. This work points toward use of simple constructions to model complex behavior, and may ultimately provide insight into modeling of a large class of porous materials. [S0094-4289(00)01604-2]
publisherThe American Society of Mechanical Engineers (ASME)
titleStructure, Mechanics and Failure of Stochastic Fibrous Networks: Part II—Network Simulations and Application
typeJournal Paper
journal volume122
journal issue4
journal titleJournal of Engineering Materials and Technology
identifier doi10.1115/1.1288768
journal fristpage460
journal lastpage468
identifier eissn1528-8889
keywordsStress
keywordsEngineering simulation
keywordsFailure
keywordsNetworks
keywordsFibers AND Microscale devices
treeJournal of Engineering Materials and Technology:;2000:;volume( 122 ):;issue: 004
contenttypeFulltext


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