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contributor authorC. Levy
contributor authorM. Perl
contributor authorH. Fang
date accessioned2017-05-08T23:57:33Z
date available2017-05-08T23:57:33Z
date copyrightNovember, 1998
date issued1998
identifier issn0094-9930
identifier otherJPVTAS-28387#349_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/120987
description abstractErosion geometry effects on the mode I stress intensity factor (SIF) for a crack emanating from the erosion’s deepest point in an autofrettaged, pressurized, thick-walled cylinder are investigated. The problem is solved via the FEM method and knowledge of the asymptotic behavior of short cracks. Autofrettage, based on von Mises yield criterion, is simulated by thermal loading and SIFs are determined by the nodal displacement method. SIFs are evaluated for a variety of relative crack lengths, a0 /W = 0.01 – 0.45, emanating from the tip of erosions of different geometries. In Part I of this paper, two configurations are considered: (a ) semi-circular erosions of relative depths of 5 percent of the cylinder’s wall thickness, W ; and (b ) arc erosions for several dimensionless radii of curvature, r′/W = 0.05 – 0.4. While deep cracks are almost unaffected by the erosion, the effective SIF for relatively short cracks is found to be significantly enhanced by the presence and geometry of the erosion and might reduce the vessel’s fatigue life.
publisherThe American Society of Mechanical Engineers (ASME)
titleCracks Emanating From an Erosion in a Pressurized Autofrettaged Thick-Walled Cylinder—Part I: Semi-Circular and Arc Erosions
typeJournal Paper
journal volume120
journal issue4
journal titleJournal of Pressure Vessel Technology
identifier doi10.1115/1.2842342
journal fristpage349
journal lastpage353
identifier eissn1528-8978
keywordsFracture (Materials)
keywordsErosion
keywordsCylinders
keywordsGeometry
keywordsWall thickness
keywordsAutofrettage
keywordsStress
keywordsFinite element methods
keywordsDisplacement
keywordsFatigue life AND Finite element model
treeJournal of Pressure Vessel Technology:;1998:;volume( 120 ):;issue: 004
contenttypeFulltext


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