contributor author | X. Q. Li | |
contributor author | Y. S. Wong | |
contributor author | A. Y. C. Nee | |
date accessioned | 2017-05-08T23:57:16Z | |
date available | 2017-05-08T23:57:16Z | |
date copyright | May, 1998 | |
date issued | 1998 | |
identifier issn | 1087-1357 | |
identifier other | JMSEFK-27323#433_1.pdf | |
identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/120786 | |
description abstract | Tool failure and chatter are two major problems during machining. To detect and distinguish the occurrences of these two abnormal conditions, a novel parallel multi-ART2 neural network has been developed. An advantage of this network is more reliable identification of a variety of complex patterns. This is due to the sharing of multi-input feature information by its multiple ART2 subnetworks which allow for finer vigilance thresholds. Using the maximum frequency-band coherence function of two acceleration signals and the relative weighted frequency-band power ratio of an acoustic emission signal as input feature information, the network has been found to identify various tool failure and chatter states in turning operations with a total of 96.4% success rate over a wide range of cutting conditions, compared to that of 80.4% obtainable with the single-ART2 neural network. | |
publisher | The American Society of Mechanical Engineers (ASME) | |
title | A Comprehensive Identification of Tool Failure and Chatter Using a Parallel Multi-ART2 Neural Network | |
type | Journal Paper | |
journal volume | 120 | |
journal issue | 2 | |
journal title | Journal of Manufacturing Science and Engineering | |
identifier doi | 10.1115/1.2830144 | |
journal fristpage | 433 | |
journal lastpage | 442 | |
identifier eissn | 1528-8935 | |
keywords | Artificial neural networks | |
keywords | Chatter | |
keywords | Failure | |
keywords | Networks | |
keywords | Signals | |
keywords | Electromagnetic spectrum | |
keywords | Acoustic emissions | |
keywords | Machining | |
keywords | Turning AND Cutting | |
tree | Journal of Manufacturing Science and Engineering:;1998:;volume( 120 ):;issue: 002 | |
contenttype | Fulltext | |