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contributor authorZhaoguo Jiang
contributor authorT. Miyamoto
contributor authorC.-J. Lu
contributor authorD. B. Bogy
date accessioned2017-05-08T23:48:29Z
date available2017-05-08T23:48:29Z
date copyrightApril, 1995
date issued1995
identifier issn0742-4787
identifier otherJOTRE9-926078#328_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/116054
description abstractMicroscopic friction and wear were measured on both the original top surfaces and freshly worn surfaces of three solid materials including a silicon wafer, a Mn-Zn ferrite block and an Au film, using a recently developed scanning probe microscope with sharp diamond tips. A critical point was observed on the friction versus normal loading force curve. The critical point divides the friction curve into two distinct regimes: a low friction regime in which the friction coefficients are from 0.03–0.06, and a high friction regime where the friction coefficients are between 0.12 and 0.38 depending on the materials tested and the tips. The critical loads at the critical points are different for different materials and different tips. But the average pressures corresponding to the critical points calculated by the Hertz elastic contact theory for different tips are close to each other for the same material. The freshly worn surfaces have tribological behaviors similar to those of the corresponding original top surfaces. Below the critical load no wear is detectable, whereas above the critical load wear is obtained with the wear depth proportional to the load. The implications are that a no-wear sliding condition is possible, for example in contact recording systems, if the asperity contact loads all remain less than the critical value for the particular sliding system.
publisherThe American Society of Mechanical Engineers (ASME)
titleDependence of Nano-Friction and Nano-Wear on Loading Force for Sharp Diamond Tips Sliding on Si, Mn-Zn Ferrite, and Au
typeJournal Paper
journal volume117
journal issue2
journal titleJournal of Tribology
identifier doi10.1115/1.2831251
journal fristpage328
journal lastpage333
identifier eissn1528-8897
keywordsForce
keywordsFriction
keywordsWear
keywordsFerrites (Magnetic materials)
keywordsDiamonds
keywordsStress
keywordsScanning probe microscopy
keywordsSemiconductor wafers AND Tribology
treeJournal of Tribology:;1995:;volume( 117 ):;issue: 002
contenttypeFulltext


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