| contributor author | R. Du | |
| contributor author | M. A. Elbestawi | |
| contributor author | S. M. Wu | |
| date accessioned | 2017-05-08T23:47:45Z | |
| date available | 2017-05-08T23:47:45Z | |
| date copyright | May, 1995 | |
| date issued | 1995 | |
| identifier issn | 1087-1357 | |
| identifier other | JMSEFK-27778#121_1.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/115620 | |
| description abstract | This paper presents a systematic study of various monitoring methods suitable for automated monitoring of manufacturing processes. In general, monitoring is composed of two phases: learning and classification. In the learning phase, the key issue is to establish the relationship between monitoring indices (selected signature features) and the process conditions. Based on this relationship and the current sensor signals, the process condition is then estimated in the classification phase. The monitoring methods discussed in this paper include pattern recognition, fuzzy systems, decision trees, expert systems and neural networks. A brief review of signal processing techniques commonly used in monitoring, such as statistical analysis, spectral analysis, system modeling, bi-spectral analysis and time-frequency distribution, is also included. | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Automated Monitoring of Manufacturing Processes, Part 1: Monitoring Methods | |
| type | Journal Paper | |
| journal volume | 117 | |
| journal issue | 2 | |
| journal title | Journal of Manufacturing Science and Engineering | |
| identifier doi | 10.1115/1.2803286 | |
| journal fristpage | 121 | |
| journal lastpage | 132 | |
| identifier eissn | 1528-8935 | |
| keywords | Manufacturing | |
| keywords | Fuzzy logic | |
| keywords | Emission spectroscopy | |
| keywords | Expert systems | |
| keywords | Modeling | |
| keywords | Signal processing | |
| keywords | Artificial neural networks | |
| keywords | Pattern recognition | |
| keywords | Signals | |
| keywords | Statistical analysis | |
| keywords | Trees AND Sensors | |
| tree | Journal of Manufacturing Science and Engineering:;1995:;volume( 117 ):;issue: 002 | |
| contenttype | Fulltext | |