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contributor authorH. M. Shang
contributor authorL. M. Tham
contributor authorF. S. Chau
date accessioned2017-05-08T23:47:20Z
date available2017-05-08T23:47:20Z
date copyrightJuly, 1995
date issued1995
identifier issn0094-4289
identifier otherJEMTA8-26972#322_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/115398
description abstractWhile defects in laminated plates are readily revealed using double-exposure shearography and holography, when an incremental vacuum pressure is applied between the exposures, the apparent defect size, measured from the boundary of the perturbed fringes, may over-estimate the actual defect size depending on the elasticity of the bond-line. In this paper, the perturbed fringes were described by a mathematical model derived from the theory of thin plates supported by a Winkler type elastic foundation which takes into consideration the elasticity of the bond-line. An iterative technique is subsequently presented for estimating the size and depth of the defect from the fringe pattern without the need to pre-determine the current elasticity of the bond-line. Laminates with a thick and highly elastic bond-line, found in foam-adhesive bonded metal laminates, and those with a thin and brittle bond-line, found in multi-layered glassflbre reinforced plastic plates, were tested. Results have shown that the defects in these laminates were accurately assessed.
publisherThe American Society of Mechanical Engineers (ASME)
titleShearographic and Holographic Assessment of Defective Laminates With Bond-Lines of Different Elasticities
typeJournal Paper
journal volume117
journal issue3
journal titleJournal of Engineering Materials and Technology
identifier doi10.1115/1.2804546
journal fristpage322
journal lastpage329
identifier eissn1528-8889
keywordsLaminates
treeJournal of Engineering Materials and Technology:;1995:;volume( 117 ):;issue: 003
contenttypeFulltext


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