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contributor authorG. E. Rahn
contributor authorS. G. Kapoor
contributor authorR. E. DeVor
date accessioned2017-05-08T23:44:50Z
date available2017-05-08T23:44:50Z
date copyrightMay, 1994
date issued1994
identifier issn1087-1357
identifier otherJMSEFK-27771#216_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/113942
description abstractAlthough Shewhart control charts have had a tremendous impact on quality improvement, the inability to precisely measure chart performance has limited their role, and subsequently overall effectiveness in the control of manufacturing processes. Measures of performance in terms of operational characteristics (OC) are defined on two distinct levels: (a) single-subgroup level, which examines the probability of a rule violation at any given subgroup (b) multiple-subgroup level, which considers the probability of one or more rule violations throughout process monitoring. Single-subgroup performance measures for X -bar charts that employ four rules are formulated. These measures are exact expressions of operational characteristics, except for the numerical approximation to the integral of the normal distribution. Applications of these models to simulated data demonstrate their accuracy in predicting chart performance. In addition, a diagnostic methodology is described which utilizes the derived performance measures to predict the mean of a shifted distribution. The proposed diagnostic procedure is illustrated in validation and application examples.
publisherThe American Society of Mechanical Engineers (ASME)
titleSingle-Subgroup Performance Measures and Diagnostic Procedures for X-Bar Control Charts
typeJournal Paper
journal volume116
journal issue2
journal titleJournal of Manufacturing Science and Engineering
identifier doi10.1115/1.2901933
journal fristpage216
journal lastpage224
identifier eissn1528-8935
keywordsQuality control charts
keywordsProbability
keywordsProcess monitoring
keywordsApproximation
keywordsGaussian distribution AND Manufacturing
treeJournal of Manufacturing Science and Engineering:;1994:;volume( 116 ):;issue: 002
contenttypeFulltext


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