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contributor authorXiangqiao Yan
contributor authorWeisheng Lei
date accessioned2017-05-08T23:44:26Z
date available2017-05-08T23:44:26Z
date copyrightApril, 1994
date issued1994
identifier issn0094-4289
identifier otherJEMTA8-26963#181_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/113704
description abstractIn the present paper, an improved strain-energy-density criterion presented recently for the commonly used fracture criterion, the minimum strain-energy-density criterion, is extended to the case of cyclic loading to predict mixed-mode fatigue crack growth in materials with different yield strengths in tension and compression. The analysis of the mixed-mode fatigue crack growth process is very complex. For the purpose of more precisely predicting the mixed mode fatigue crack growth process, we developed a numerical scheme in which the improved fatigue crack growth criterion is combined with the displacement discontinuity method, a boundary element method. In the fatigue crack growth analysis of an inclined crack under uniaxial cyclic loading, the stress intensity factors for each increment of the crack growth are calculated by means of the displacement discontinuity method. Fatigue growth analysis of an inclined crack under uniaxial cyclic loading in materials with different yield strengths in tension and compression is carried out.
publisherThe American Society of Mechanical Engineers (ASME)
titleFatigue Growth Analysis of an Inclined Crack Under Uniaxial Cyclic Loading in Materials With Different Yield Strengths in Tension and Compression
typeJournal Paper
journal volume116
journal issue2
journal titleJournal of Engineering Materials and Technology
identifier doi10.1115/1.2904270
journal fristpage181
journal lastpage186
identifier eissn1528-8889
keywordsFatigue
keywordsFracture (Materials)
keywordsCompression
keywordsTension
keywordsFatigue cracks
keywordsDensity
keywordsDisplacement
keywordsBoundary element methods
keywordsFracture (Process) AND Stress
treeJournal of Engineering Materials and Technology:;1994:;volume( 116 ):;issue: 002
contenttypeFulltext


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