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contributor authorW. R. DeVries
contributor authorCheng-Jih Li
date accessioned2017-05-08T23:20:41Z
date available2017-05-08T23:20:41Z
date copyrightMay, 1985
date issued1985
identifier issn1087-1357
identifier otherJMSEFK-27713#167_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/100117
description abstractStylus methods for measuring surface topography impose certain limits on resolving the true profile of a surface. These limits are primarily due to the finite geometric size of the stylus. In this paper, kinematic and geometric algorithms are developed to compensate for stylus geometry so as to present a better picture of the true surface profile. To demonstrate their effectiveness, these algorithms are applied to simulated deterministic and stochastic profile measurements.
publisherThe American Society of Mechanical Engineers (ASME)
titleAlgorithms to Deconvolve Stylus Geometry From Surface Profile Measurements
typeJournal Paper
journal volume107
journal issue2
journal titleJournal of Manufacturing Science and Engineering
identifier doi10.1115/1.3185981
journal fristpage167
journal lastpage174
identifier eissn1528-8935
keywordsMeasurement
keywordsAlgorithms AND Geometry
treeJournal of Manufacturing Science and Engineering:;1985:;volume( 107 ):;issue: 002
contenttypeFulltext


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