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Sub-100 μm SnAg Solder Bumping Technology and the Bump Reliability
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Lead-free solder bumping and its related interconnection and reliability are becoming one of the important issues in today’s electronic packaging industry. In this paper, alloy electroplating was ...
Integration of Ta–N Thin Film Resistors on Anodic Alumina MCM-D Substrate
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: The aim of this work is to evaluate the changes in microstructures and electrical properties of a tantalum nitride (Ta–N) thin film integrated on an aluminum anodization multichip module deposited ...
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