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    Submodeling Analysis for Path-Dependent Thermomechanical Problems 

    Source: Journal of Electronic Packaging:;2005:;volume( 127 ):;issue: 002:;page 135
    Author(s): Tong Hong Wang; Yi-Shao Lai
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: In a finite element analysis, when localized behavior of a large model is of particular concern, generally one would refine the mesh until it captures the local solution adequately. Submodeling ...
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    Numerical Investigation of Thermal Dissipation on Quad Flat Package With Unattached Heat Spreader 

    Source: Journal of Electronic Packaging:;2007:;volume( 129 ):;issue: 003:;page 366
    Author(s): Tong Hong Wang; Yi-Shao Lai
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Due to cost and process considerations, sometimes a drop-in heat spreader is incorporated in a quad flat package, which is not attached to the die pad. Consequently, due to mismatch of thermal ...
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    Effect of Underfill Thermomechanical Properties on Thermal Cycling Fatigue Reliability of Flip-Chip Ball Grid Array 

    Source: Journal of Electronic Packaging:;2004:;volume( 126 ):;issue: 004:;page 560
    Author(s): Tong Hong Wang; Yi-Shao Lai; Jenq-Dah Wu
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Plane two-dimensional finite element analysis was applied to study the effect of underfill thermomechanical properties on the potential of thermal fatigue failure for flip-chip ball grid array. ...
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    Transient Thermal Analysis for Board-Level Chip-Scale Packages Subjected to Coupled Power and Thermal Cycling Test Conditions 

    Source: Journal of Electronic Packaging:;2006:;volume( 128 ):;issue: 003:;page 281
    Author(s): Tong Hong Wang; Chang-Chi Lee; Yi-Shao Lai; Yu-Cheng Lin
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: In this work, thermal characteristics of a board-level chip-scale package, subjected to coupled power and thermal cycling test conditions defined by JEDEC, are investigated through the transient ...
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    Influence of Power Cycling Durations on Thermal and Fatigue Reliability Characteristics of Board-Level Chip-Scale Packages 

    Source: Journal of Electronic Packaging:;2009:;volume( 131 ):;issue: 001:;page 11001
    Author(s): Tong Hong Wang; Chang-Chi Lee; Yi-Shao Lai; Kuo-Yuan Lee
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The sequential thermal-mechanical coupling analysis, which solves in turn the transient temperature field and subsequent thermomechanical deformations, was performed in this work to investigate ...
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