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    Four Wire Bridge Measurements of Silicon van der Pauw Stress Sensors 

    Source: Journal of Electronic Packaging:;2014:;volume( 136 ):;issue: 004:;page 41014
    Author(s): Jaeger, Richard C.; Motalab, Mohammad; Hussain, Safina; Suhling, Jeffrey C.
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Under the proper orientations and excitations, the transverse output of rotationally symmetric fourcontact van der Pauw (VDP) stress sensors depends upon only the inplane shear stress or the difference of the inplane normal ...
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    Four-Wire Bridge Measurements of Silicon van der Pauw Stress Sensors 

    Source: Journal of Electronic Packaging:;2018:;volume( 140 ):;issue: 001:;page 17001
    Author(s): Jaeger, Richard C.; Motalab, Mohammad; Hussain, Safina; Suhling, Jeffrey C.
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Improvements in turbine design methods have resulted in the development of blade profiles with both high lift and good Reynolds lapse characteristics. An increase in aerodynamic loading of blades in the low-pressure turbine ...
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    Diagonal Mode van der Pauw Stress Sensors: Proof of Diagonal-Mode Conjecture 

    Source: Journal of Electronic Packaging:;2018:;volume( 140 ):;issue: 004:;page 44501
    Author(s): Jaeger, Richard C.; Suhling, Jeffrey C.; Chen, Jun
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The conjecture discussed in our previous paper [Jaeger, R. C., Motalab, M., Hussain, S., and Suhling, J. C., 2014, “Four-Wire Bridge Measurements of Silicon van der Pauw Stress Sensors,” ASME J. Electron. Packag., 136(4), ...
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