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    Low Cycle Fatigue Testing of Ball Grid Array Solder Joints under Mixed-Mode Loading Conditions 

    Source: Journal of Electronic Packaging:;2005:;volume( 127 ):;issue: 003:;page 237
    Author(s): Tae-Sang Park; Soon-Bok Lee
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: To give a proper and accurate estimation of the fatigue life of ball grid array (BGA) solder joints, a mechanical fatigue test method under mixed-mode loading is proposed. Experiments were ...
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    Measurement of Creep and Relaxation Behaviors of Wafer-Level CSP Assembly Using Moiré Interferometry 

    Source: Journal of Electronic Packaging:;2003:;volume( 125 ):;issue: 002:;page 282
    Author(s): Suk-Jin Ham; Soon-Bok Lee
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: In this paper, the creep and relaxation behaviors of a wafer-level CSP assembly under two types of thermal loading conditions were investigated using high sensitivity moiré interferometry. One ...
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    A Phenomenological Model for Intergranular Failure by r-type and Wedge-Type Cavitation 

    Source: Journal of Engineering Materials and Technology:;1995:;volume( 117 ):;issue: 003:;page 311
    Author(s): Soon-Bok Lee; Alan K. Miller
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Equations to predict local intergranular failure (by “r”-type and “wedge”-type cavitation and the coupling between them) have been developed. The derivation has utilized physically based concepts ...
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    Measurement and Characterization of the Moisture-Induced Properties of ACF Package 

    Source: Journal of Electronic Packaging:;2009:;volume( 131 ):;issue: 002:;page 21012
    Author(s): Ji-Young Yoon; Ilho Kim; Soon-Bok Lee
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This study is to observe the exact behavior of anisotropic conductive adhesion (ACF) package under humid environments by obtaining the moisture-induced properties such as diffusion coefficient ...
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    Thermal Cycling Reliability and Delamination of Anisotropic Conductive Adhesives Flip Chip on Organic Substrates With Emphasis on the Thermal Deformation 

    Source: Journal of Electronic Packaging:;2005:;volume( 127 ):;issue: 002:;page 86
    Author(s): Woon-Seong Kwon; Suk-Jin Ham; Soon-Bok Lee; Member ASME; Myung-Jin Yim; Kyung-Wook Paik
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: One of the most important issues whether anisotropic conductive film (ACF) interconnection technology is suitable to be used for flip chip on organic board applications is thermal cycling ...
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