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Raman and Infrared Thermometry for Microsystems
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: This paper reports and compares Raman and infrared thermometry measurements along the legs and on the shuttle of a SOI (silicon on insulator) bentbeam thermal microactuator. Raman thermometry offers micron spatial resolution ...
Mean Free Path Effects on the Experimentally Measured Thermal Conductivity of Single Crystal Silicon Microbridges
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Accurate thermal conductivity values are essential for the successful modeling, design, and thermal management of microelectromechanical systems (MEMS) and devices. However, the experimental technique best suited to measure ...
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