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    Experimental Characterization of Monotonic and Fatigue Delamination of Novel Underfill Materials 

    Source: Journal of Electronic Packaging:;2006:;volume( 128 ):;issue: 004:;page 405
    Author(s): Saketh Mahalingam; Sandeep Tonapi; Suresh K. Sitaraman; Kunal Goray
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: No-flow underfill materials reduce assembly processing steps and can potentially be used in fine-pitch flip chip on organic board assemblies. Such no-flow underfills, when filled with nano-scale ...
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    Theoretical Modeling and Prediction of Delamination in Flip Chip Assemblies With Nanofilled No-Flow Underfill Materials 

    Source: Journal of Electronic Packaging:;2008:;volume( 130 ):;issue: 004:;page 41005
    Author(s): Saketh Mahalingam; Ananth Prabhakumar; Suresh K. Sitaraman; Sandeep Tonapi
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The occurrence of passivation-underfill interfacial delamination is detrimental to the reliability of the flip chip assembly as it can result in the premature cracking of the solder bumps. In ...
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    Development of Novel Filler Technology for No-Flow and Wafer Level Underfill Materials 

    Source: Journal of Electronic Packaging:;2005:;volume( 127 ):;issue: 002:;page 77
    Author(s): Slawomir Rubinsztajn; Donald Buckley; John Campbell; David Esler; Eric Fiveland; Ananth Prabhakumar; Donna Sherman; Sandeep Tonapi
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Flip chip technology is one of the fastest growing segments of electronic packaging with growth being driven by the demands such as cost reduction, increase of input/output density, package ...
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    Micron and Submicron-Scale Characterization of Interfaces in Thermal Interface Material Systems 

    Source: Journal of Electronic Packaging:;2006:;volume( 128 ):;issue: 002:;page 130
    Author(s): Arun Gowda; K. Srihari; Florian Schattenmann; David Esler; Sandeep Tonapi; Annita Zhong
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: One of the key challenges in the thermal management of electronic packages are interfaces, such as those between the chip and heat spreader and the interface between a heat spreader and heat ...
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