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    Determination of Fracture Toughness for Metal/Polymer Interfaces 

    Source: Journal of Electronic Packaging:;1999:;volume( 121 ):;issue: 004:;page 275
    Author(s): V. Sundararaman; S. K. Sitaraman
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This work focuses on the interpretation of experimental results obtained from fracture toughness tests conducted for a typical metal/polymer bimaterial interface similar to those encountered in ...
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    Warpage and Interfacial Stress Distribution in a Single-Level Integrated Module (SLIM) 

    Source: Journal of Electronic Packaging:;1997:;volume( 119 ):;issue: 003:;page 197
    Author(s): R. C. Dunne; S. K. Sitaraman
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The thermomechanical behavior of a new multilayered substrate with embedded passive components is the focus of this study. Such structures are typically susceptible to localized interfacial stresses ...
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    New Reworkable High Temperature Low Modulus (in Excess of 400–500 °C) Adhesives for MCM-D Assembly 

    Source: Journal of Electronic Packaging:;2000:;volume( 122 ):;issue: 001:;page 55
    Author(s): Jiali Wu; S. K. Sitaraman; C. P. Wong; Randy T. Pike
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Large area substrate processing is a key solution for improving the productivity of multi-chip module deposition (MCM-D) technology. This project is focused on high temperature low modulus polymeric ...
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