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    Shorter Field Life in Power Cycling for Organic Packages 

    Source: Journal of Electronic Packaging:;2007:;volume( 129 ):;issue: 001:;page 28
    Author(s): S. B. Park; Izhar Z. Ahmed
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The importance of power cycling as a mean of reliability assessment was revisited for flip chip plastic ball grid array (FC-PBGA) packages. Conventionally, reliability was addressed empirically ...
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    Minimizing Stress Levels in Piezoelectric Media Containing Elliptical Voids 

    Source: Journal of Applied Mechanics:;1997:;volume( 064 ):;issue: 003:;page 466
    Author(s): S. B. Park; G. P. Carman
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: In this paper we present an analytical solution to calculate the stress concentrations around an elliptical void in a piezoelectric medium subjected to electrical loading. We show that the ...
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    Comparative Studies on Solder Joint Reliability of Plastic and Ceramic Ball Grid Array Packages of the Same Form Factor Under Power and Accelerated Thermal Cycling 

    Source: Journal of Electronic Packaging:;2008:;volume( 130 ):;issue: 004:;page 41004
    Author(s): S. B. Park; Rahul Joshi; Izhar Ahmed; Soonwan Chung
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Experimental and numerical techniques are employed to assess the thermomechanical behavior of ceramic and organic flip chip packages under power cycling (PC) and accelerated thermal cycling (ATC). ...
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    Measuring Strain Distribution During Mesoscopic Domain Reorientation in a Ferroelectric Material 

    Source: Journal of Engineering Materials and Technology:;1998:;volume( 120 ):;issue: 001:;page 1
    Author(s): S. B. Park; S. S. Park; G. P. Carman; H. T. Hahn
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: In this paper, we present the results of an experimental study focused on understanding the strain concentrations arising due to nonlinear phenomena associated with polarization switching. A moire ...
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    Measurement of Transient Dynamic Response of Circuit Boards of a Handheld Device During Drop Using 3D Digital Image Correlation 

    Source: Journal of Electronic Packaging:;2008:;volume( 130 ):;issue: 004:;page 44502
    Author(s): S. B. Park; Chirag Shah; Jae B. Kwak; Changsoo Jang; Soonwan Chung; James M. Pitarresi
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: In this work, a new experimental methodology for analyzing the drop impact response is assessed using a pair of high-speed digital cameras and 3D digital image correlation software. Two different ...
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