YaBeSH Engineering and Technology Library

    • Journals
    • PaperQuest
    • YSE Standards
    • YaBeSH
    • Login
    Search 
    •   YE&T Library
    • Search
    •   YE&T Library
    • Search
    • All Fields
    • Source Title
    • Year
    • Publisher
    • Title
    • Subject
    • Author
    • DOI
    • ISBN
    Advanced Search
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Search

    Show Advanced FiltersHide Advanced Filters

    Filters

    Use filters to refine the search results.

    Now showing items 1-3 of 3

    • Relevance
    • Title Asc
    • Title Desc
    • Year Asc
    • Year Desc
    • 5
    • 10
    • 20
    • 40
    • 60
    • 80
    • 100
  • Export
    • CSV
    • RIS
    • Sort Options:
    • Relevance
    • Title Asc
    • Title Desc
    • Issue Date Asc
    • Issue Date Desc
    • Results Per Page:
    • 5
    • 10
    • 20
    • 40
    • 60
    • 80
    • 100

    A Board Level Study of an Array of Ball Grid Components—Aerodynamic and Thermal Measurements 

    Source: Journal of Electronic Packaging:;2003:;volume( 125 ):;issue: 004:;page 480
    Author(s): Reena Cole; Mark Davies; Jeff Punch
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Electronic package manufacturers publish thermal characteristics of components, which are measured using standard tests, measuring a thermal resistance value for a single component on a standard ...
    Request PDF

    Factors Affecting the Operational Thermal Resistance of Electronic Components 

    Source: Journal of Electronic Packaging:;2000:;volume( 122 ):;issue: 003:;page 185
    Author(s): Mark R. D. Davies; John Lohan; Reena Cole
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The thermal resistance of electronic components is known to often differ considerably between standard test conditions and those found in service. One way to correct for this is to use ...
    Request PDF

    Forced Convection Board Level Thermal Design Methodology for Electronic Systems 

    Source: Journal of Electronic Packaging:;2001:;volume( 123 ):;issue: 002:;page 120
    Author(s): Reena Cole; Tara Dalton; Jeff Punch; Mark R. Davies; Ronan Grimes
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The case is made for the continued use of single valued thermal resistances for the prediction of component junction temperature, and, hence, reliability. These values are adjusted using empirically ...
    Request PDF
    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian
     

    Author

    Publisher

    Year

    Type

    Content Type

    Publication Title

    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian