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    Raman and Infrared Thermometry for Microsystems 

    Source: Journal of Thermal Science and Engineering Applications:;2013:;volume( 005 ):;issue: 003:;page 31011
    Author(s): Phinney, Leslie M.; Lu, Wei; Serrano, Justin R.
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper reports and compares Raman and infrared thermometry measurements along the legs and on the shuttle of a SOI (silicon on insulator) bentbeam thermal microactuator. Raman thermometry offers micron spatial resolution ...
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    Mean Free Path Effects on the Experimentally Measured Thermal Conductivity of Single Crystal Silicon Microbridges 

    Source: Journal of Heat Transfer:;2013:;volume( 135 ):;issue: 009:;page 91103
    Author(s): English, Timothy S.; Phinney, Leslie M.; Hopkins, Patrick E.; Serrano, Justin R.
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Accurate thermal conductivity values are essential for the successful modeling, design, and thermal management of microelectromechanical systems (MEMS) and devices. However, the experimental technique best suited to measure ...
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