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    Failure Analysis of Miniature Solder Specimen 

    Source: Journal of Electronic Packaging:;2004:;volume( 126 ):;issue: 001:;page 100
    Author(s): Y. Wei; H. E. Fang; T. J. Lim; W. Lu; M. K. Neilsen; C. L. Chow
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The effects of specimen geometry size on the behavior of 63Sn-37Pb solder are investigated both experimentally in the laboratory and analytically with finite-element simulations. The simulations ...
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    Characteristics of Creep Damage for 60 Sn-40 Pb Solder Material 

    Source: Journal of Electronic Packaging:;2001:;volume( 123 ):;issue: 003:;page 278
    Author(s): Y. Wei; H. E. Fang; M. K. Neilsen; C. L. Chow
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper presents a viscoplasticity model taking into account the effects of change in grain or phase size and damage on the characterization of creep damage in 60 Sn-40 Pb solder. Based ...
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    A Practical Viscoplastic Damage Model for Lead-Free Solder 

    Source: Journal of Electronic Packaging:;2006:;volume( 128 ):;issue: 001:;page 71
    Author(s): A. F. Fossum; D. M. Pierce; P. T. Vianco; M. K. Neilsen
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper summarizes the results of a program to construct an internal variable viscoplastic damage model to characterize 95.5Sn–3.9Ag–0.6Cu (wt.%) lead-free solder under cyclic thermomechanical ...
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    On the Strain Rate- and Temperature-Dependent Tensile Behavior of Eutectic Sn–Pb Solder 

    Source: Journal of Electronic Packaging:;2011:;volume( 133 ):;issue: 003:;page 31009
    Author(s): B. L. Boyce; L. N. Brewer; M. J. Perricone; M. K. Neilsen
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The present study examines the thermomechanical strain-rate sensitivity of eutectic 63Sn–37Pb solder over a broad range of strain-rates from 0.0002 s–1 to 200 s–1 , thus encompassing failure ...
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    Development of Hermetic Microminiature Connectors 

    Source: Journal of Electronic Packaging:;1991:;volume( 113 ):;issue: 004:;page 405
    Author(s): M. K. Neilsen; L. A. Andrews; S. L. Monroe; H. L. McCollister
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Miniaturization of hermetic packages has provided the incentive to develop a new family of hermetic microminiature connectors. Microminiature connectors, with a pin spacing of 1.27 mm, have ...
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