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High Frequency and Low Temperature Thermosonic Bonding of Lead Free Microsolder Ball on Silver Pad Without Flux
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Leadfree solder balls are environment friendly; however, they require a high bonding temperature, which causes problems in the microelectronics package industry. To reduce the bonding temperature, a 60 kHz highfrequency ...
Variable Length Link Spring Model for Kink Formation During Wire Bonding
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Kinks have a strong influence on the structural performance of wire bonds. In this study, a variablelength linkspring model has been developed to better understand kink formation. In this model, a gold wire was decomposed ...
Three-Dimensional Simulation of Aggregate and Asphalt Mixture Using Parameterized Shape and Size Gradation
Publisher: American Society of Civil Engineers
Abstract: Aggregate occupies at least three-quarters of the volume of asphalt mixture and can significantly affect the performance of pavement. The geometrical morphology influences the slippage and interlock among aggregates for ...
Design and Fabrication of Leadless Package Structure for Pressure Sensors
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Silicon piezoresistive pressure sensors can only operate below 125 °C due to the leakage current of the PN junction. However, silicon-on-insulator (SOI) high-temperature pressure sensors use SiO2 for total dielectric ...
Optimization of Micropillars Electroplating Bonding Processes and Additives
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: With the increasing interconnect density of electronic components, copper–copper direct bonding technology has garnered increasing attention from researchers. The electroplating bonding method is an efficient copper pillar ...
Research on Reliability of Ni/Sn/Cu(Ni) Copper Pillar Bump Under Thermoelectric Loading
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: With the development of packaging devices toward high performance and high density, electronic devices are subjected to thermo-electric stresses under service conditions, which has become a particularly important reliability ...