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A Scanning Electron Microscope With Two Secondary Electron Detectors and Its Application to the Surface Topography Measurements of Magnetic Media
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: A scanning electron microscope (SEM) with two secondary electron detectors is applied for the surface topography measurement of magnetic media. The principle of gradient determination of the SEM ...
Evaluation of Creep-Fatigue Damage Interaction in HK40 Alloy
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: In order to establish design criteria for materials which may sustain creep-fatigue damage, the creep rupture and creep-fatigue behavior of a high-carbon centrifugal cast steel was investigated ...