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RISTime-Resolved Micro-Raman Thermometry for Microsystems in Motion
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Micro-Raman thermometry has been demonstrated to be a feasible technique for obtaining surface temperatures with micron-scale spatial resolution for microelectronic and microelectromechanical systems ...
Re-examining Electron-Fermi Relaxation in Gold Films With a Nonlinear Thermoreflectance Model
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: In this work, we examine Fermi relaxation in 20 nm Au films with pump-probe themoreflectance using a thin film, intraband thermoreflectance model. Our results indicate that the Fermi relaxation ...
Criteria for Cross-Plane Dominated Thermal Transport in Multilayer Thin Film Systems During Modulated Laser Heating
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Pump-probe transient thermoreflectance (TTR) techniques are powerful tools for measuring the thermophysical properties of thin films, such as thermal conductivity, Λ, or thermal boundary conductance, ...
Raman Thermometry Measurements and Thermal Simulations for MEMS Bridges at Pressures From 0.05 Torr to 625 Torr
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: This paper reports on experimental and computational investigations into the thermal performance of microelectromechanical systems (MEMS) as a function of the pressure of the surrounding gas. High ...