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    Deformation and Failure in Thin Films/Substrate Systems: Methods of Theoretical Analysis 

    Source: Applied Mechanics Reviews:;2005:;volume( 058 ):;issue: 005:;page 338
    Author(s): Leon L. Mishnaevsky; Dietmar Gross
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper reviews the theoretical models and methods of analysis of deformation, damage and fracture in thin film/substrate systems. The mechanisms and models of the plastic deformation of thin ...
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