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    Integrated Sustainability Analysis of Atomic Layer Deposition for Microelectronics Manufacturing 

    Source: Journal of Manufacturing Science and Engineering:;2010:;volume( 132 ):;issue: 003:;page 30918
    Author(s): Chris Y. Yuan; David A. Dornfeld
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Atomic layer deposition (ALD) is a promising nanotechnology for wide applications in microelectronics manufacturing due to its ability to control layer growth at atomic scale. Sustainability of ...
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    A Schematic Method for Sustainable Material Selection of Toxic Chemicals in Design and Manufacturing 

    Source: Journal of Mechanical Design:;2010:;volume( 132 ):;issue: 009:;page 91014
    Author(s): Chris Y. Yuan; David A. Dornfeld
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Toxic chemicals used in product design and manufacturing are grave concerns due to their toxic impact on human health. Implementing sustainable material selection strategies on toxic chemicals ...
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