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    Development of a High Cycle Fatigue Life Prediction Model for Thin Film Silicon Structures 

    Source: Journal of Electronic Packaging:;2018:;volume( 140 ):;issue: 003:;page 31008
    Author(s): Chang, Chia-Cheng; Lin, Sheng-Da; Chiang, Kuo-Ning
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The fatigue characteristics of microelectromechanical systems (MEMS) material, such as silicon or polysilicon, have become very important. Many studies have focused on this topic, but none have defined a good methodology ...
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