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    Creep Analysis and Thermal-Fatigue Life Prediction of the Lead-Free Solder Sealing Ring of a Photonic Switch 

    Source: Journal of Electronic Packaging:;2002:;volume( 124 ):;issue: 004:;page 403
    Author(s): J. Lau; Z. Mei; S. Pang; C. Amsden; J. Rayner; S. Pan
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Thermal reliability of the solder sealing ring of Agilent Technologies’ bubble-actuated photonic cross-connect switches has been investigated in this paper. Emphasis is placed on the determination ...
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