YaBeSH Engineering and Technology Library

    • Journals
    • PaperQuest
    • YSE Standards
    • YaBeSH
    • Login
    Search 
    •   YE&T Library
    • Search
    •   YE&T Library
    • Search
    • All Fields
    • Source Title
    • Year
    • Publisher
    • Title
    • Subject
    • Author
    • DOI
    • ISBN
    Advanced Search
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Search

    Show Advanced FiltersHide Advanced Filters

    Filters

    Use filters to refine the search results.

    Now showing items 1-6 of 6

    • Relevance
    • Title Asc
    • Title Desc
    • Year Asc
    • Year Desc
    • 5
    • 10
    • 20
    • 40
    • 60
    • 80
    • 100
  • Export
    • CSV
    • RIS
    • Sort Options:
    • Relevance
    • Title Asc
    • Title Desc
    • Issue Date Asc
    • Issue Date Desc
    • Results Per Page:
    • 5
    • 10
    • 20
    • 40
    • 60
    • 80
    • 100

    Calibrate Piezoresistive Stress Sensors Through the Assembled Structure 

    Source: Journal of Electronic Packaging:;2003:;volume( 125 ):;issue: 002:;page 289
    Author(s): Ben-Je Lwo; Shen-Yu Wu
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: In this work, a simple assembled structure was designed and fabricated so that the calibration procedures on piezoresistive stress sensors for microelectronic packaging can be simpler, more ...
    Request PDF

    In Situ Chip Stress Extractions for LFBGA Packages Through Piezoresistive Sensors 

    Source: Journal of Electronic Packaging:;2009:;volume( 131 ):;issue: 003:;page 31003
    Author(s): Ben-Je Lwo; Jeng-Shian Su; Hsien Chung
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Piezoresistive sensors have been demonstrated to be an accurate and efficient tool for stress measurements on chip surfaces inside microelectronic packaging. In this work, test chips with ...
    Request PDF

    Over-Temperature Forecasts on Electronic Packages Through a Transient R–C Model 

    Source: Journal of Electronic Packaging:;2000:;volume( 122 ):;issue: 001:;page 42
    Author(s): Ben-Je Lwo; Kun-Fu Tseng; Ching-Hsing Kao; Luke Su Lu
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Based on experimental data, a simple R–C (thermal resistance–heat capacitance) model with software precaution strategies are proposed in this paper to predict the steady-state temperature of the ...
    Request PDF

    On the Study of Piezoresistive Stress Sensors for Microelectronic Packaging 

    Source: Journal of Electronic Packaging:;2002:;volume( 124 ):;issue: 001:;page 22
    Author(s): Ben-Je Lwo; Ching-Hsing Kao; Tung-Sheng Chen; Yao-Shing Chen
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Stress measurements in microelectronic packaging through piezoresistive sensors take the advantage of both in-situ and nondestructive. In this study, test chips with both p-type and n-type ...
    Request PDF

    In-Plane Packaging Stress Measurements Through Piezoresistive Sensors 

    Source: Journal of Electronic Packaging:;2002:;volume( 124 ):;issue: 002:;page 115
    Author(s): Ben-Je Lwo; Tung-Sheng Chen; Ching-Hsing Kao; Yu-Lin Lin
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: In our previous works, the piezoresistive sensors have been demonstrated to be accurate and efficient tools for stress measurements in microelectronic packaging. In this study, we first designed ...
    Request PDF

    Parameter Calibrations on MOSFET Stress Sensors 

    Source: Journal of Electronic Packaging:;2012:;volume( 134 ):;issue: 003:;page 31004
    Author(s): Ren-Tzung Tan; Kun-Fu Tseng; Hsien Chung; Ben-Je Lwo; Chun-Pai Tang
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Due to the carrier mobility changes with the mechanical loading and its small size, the MOSFET (metal-oxide-semiconductor field-effective-transistor) has the potential to be a suitable chip stress ...
    Request PDF
    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian
     

    Author

    ... View More

    Publisher

    Year

    Type

    Content Type

    Publication Title

    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian