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Calibrate Piezoresistive Stress Sensors Through the Assembled Structure
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: In this work, a simple assembled structure was designed and fabricated so that the calibration procedures on piezoresistive stress sensors for microelectronic packaging can be simpler, more ...
In Situ Chip Stress Extractions for LFBGA Packages Through Piezoresistive Sensors
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Piezoresistive sensors have been demonstrated to be an accurate and efficient tool for stress measurements on chip surfaces inside microelectronic packaging. In this work, test chips with ...
Over-Temperature Forecasts on Electronic Packages Through a Transient R–C Model
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Based on experimental data, a simple R–C (thermal resistance–heat capacitance) model with software precaution strategies are proposed in this paper to predict the steady-state temperature of the ...
On the Study of Piezoresistive Stress Sensors for Microelectronic Packaging
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Stress measurements in microelectronic packaging through piezoresistive sensors take the advantage of both in-situ and nondestructive. In this study, test chips with both p-type and n-type ...
In-Plane Packaging Stress Measurements Through Piezoresistive Sensors
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: In our previous works, the piezoresistive sensors have been demonstrated to be accurate and efficient tools for stress measurements in microelectronic packaging. In this study, we first designed ...
Parameter Calibrations on MOSFET Stress Sensors
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Due to the carrier mobility changes with the mechanical loading and its small size, the MOSFET (metal-oxide-semiconductor field-effective-transistor) has the potential to be a suitable chip stress ...
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