Search
Now showing items 1-2 of 2
Enhancing Image Segmentation Model in Computing Void Percentage With Mask RCNN
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Automating quality control has been an ongoing effort, especially when manufacturing large flip-chips. One such method is through employing the convolutional neural network (CNN). This work studied the optimum setup of the ...
Effect of Dispensing Type on Void Formation Using Convolutional Neural Network
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Underfilling in flip chip packages is a critical component of reliability. This study utilized I-type, L-type, and U-type dispensing methods to address the issue, namely, voiding that creates empty spaces, which compromises ...