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    Finite Element Viscoelastic Analysis of Temperature and Moisture Effects in Electronic Packaging 

    Source: Journal of Electronic Packaging:;1995:;volume( 117 ):;issue: 003:;page 192
    Author(s): Arvind Krishna; B. D. Harper; J. K. Lee
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Several workers have demonstrated the presence of singular stress fields near the edge of a bimaterial interface subject to thermal gradients. Many of the analyses in the literature are limited ...
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