Search
Now showing items 1-2 of 2
Theoretical Modeling and Prediction of Delamination in Flip Chip Assemblies With Nanofilled No-Flow Underfill Materials
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: The occurrence of passivation-underfill interfacial delamination is detrimental to the reliability of the flip chip assembly as it can result in the premature cracking of the solder bumps. In ...
Development of Novel Filler Technology for No-Flow and Wafer Level Underfill Materials
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Flip chip technology is one of the fastest growing segments of electronic packaging with growth being driven by the demands such as cost reduction, increase of input/output density, package ...
CSV
RIS