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    Lifetime Prediction of Solder Materials 

    Source: Journal of Electronic Packaging:;1989:;volume( 111 ):;issue: 003:;page 179
    Author(s): A. Zubelewicz; R. Berriche; L. M. Keer; M. E. Fine
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Fatigue lifetimes of lead-low tin solders have been investigated. Results indicate that the Coffin-Manson law does not necessarily fit experimental data. The phenomenon can be correlated with a ...
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    Characterizing the Failure Envelope of a Conductive Adhesive 

    Source: Journal of Electronic Packaging:;1999:;volume( 121 ):;issue: 001:;page 23
    Author(s): D. Olliff; M. Gaynes; R. Kodnani; J. Qu; A. Zubelewicz
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper focuses on mechanical testing designed to determine the static failure envelope for a conductive adhesive. Samples were made by bonding copper pegs together with the conductive adhesive. ...
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    Micromechanism approach to model creep Fatigue Interaction in Lead‐Tin Alloy 

    Source: Journal of Engineering Mechanics:;1991:;Volume ( 117 ):;issue: 003
    Author(s): M. P. Robert; A. Zubelewicz; L. M. Keer
    Publisher: American Society of Civil Engineers
    Abstract: An elasto-viscoplastic constitutive equation is derived for a lead-tin alloy used in the microelectronics industry. This crystalline material exhibits nonlinear characteristics, such as strain hardening and saturation ...
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    Micromechanical Method to Predict Fatigue Life of Solder 

    Source: Journal of Electronic Packaging:;1990:;volume( 112 ):;issue: 002:;page 179
    Author(s): A. Zubelewicz; Q. Guo; E. C. Cutiongco; M. E. Fine; L. M. Keer
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Fatigue lifetimes of low-tin high-lead and tin-lead eutectic solders under total strain controlled tension-tension tests were studied in this paper. Based on the stress and strain micro-macro ...
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