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contributor authorAditya, S.
contributor authorJayanth, G. R.
contributor authorMohanty, A. K.
date accessioned2026-08-23T08:26:16Z
date available2026-08-23T08:26:16Z
date copyright2026/01/01
date issued2026
identifier issn0022-0434
identifier otherds-24-1311.pdf
identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4316551
description abstractAbstract. Trapping of magnetic microparticles enables them to be used as end-effectors in various microrobotic applications. Parametric excitation is an attractive method to trap such particles, and in such a case, the trapped particle obeys the Mathieu equation. In this paper, an approximate solution is first proposed for the Mathieu equation by using Floquet theory. Next, a simplified second-order linear time-invariant dynamic model is proposed to describe the secular motion of the magnetic particle. Finally, a simple method is proposed to evaluate the Mathieu stiffness experimentally. The approximate solution is shown to be a linear combination of harmonics of the frequency of the parametric excitation and the solutions are shown to agree with numerical results to within 1% for different parameters. Subsequently, experiments are performed to validate the proposed model. It is shown that the experimental results of the particle tracking step and ramp input waveforms are in close agreement with those predicted by theory. These results are subsequently employed to extract the Mathieu stiffness and damping coefficient. Both are shown to agree well with the estimates obtained from theory and to depend in the theoretically expected manner on the frequency and amplitude of parametric excitation.
publisherThe American Society of Mechanical Engineers (ASME)
titleSecular Dynamics of Parametrically Excited Magnets: Modeling and Experimental Validation
typeJournal Paper
journal volume148
journal issue1
journal titleJournal of Dynamic Systems, Measurement, and Control
identifier doi10.1115/1.4069532
journal fristpage848
journal lastpage868
page21
treeJournal of Dynamic Systems, Measurement, and Control:;2026:;volume( 148 ):;issue:001
contenttypeFulltext


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