YaBeSH Engineering and Technology Library

    • Journals
    • PaperQuest
    • YSE Standards
    • YaBeSH
    • Login
    View Item 
    •   YE&T Library
    • ASME
    • Journal of Electronic Packaging
    • View Item
    •   YE&T Library
    • ASME
    • Journal of Electronic Packaging
    • View Item
    • All Fields
    • Source Title
    • Year
    • Publisher
    • Title
    • Subject
    • Author
    • DOI
    • ISBN
    Advanced Search
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Archive

    Improved Productivity With High-Speed Imaging for Printed Circuit Board Applications in Electronics Assembly

    Source: Journal of Electronic Packaging:;2026:;volume( 148 ):;issue:001::page 15921
    Author:
    Agarwal, Sunny
    DOI: 10.1115/1.4069682
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Abstract. Machine vision inspections need to go through complex surface textures, part deviations/curvatures, nonuniform lighting, highly reflective surfaces, and unpredictable defects, which introduce image quality issues leading to serious inspection challenges. Machine vision systems struggle to appreciate part variability and deviation due to rotation, scaling, and image distortion when it comes to locating distinct features on very similar parts. All these factors combined make it difficult for vision systems to program and work efficiently. This newly offered vision package has improved camera optics with a large field of view (FOV) illumination, providing higher resolution images for better dot placement along with a reduction in cycle time. This includes advanced electronics like a higher resolution camera, better on/off-axis lighting to maintain uniform lighting across the full field of view. Maintaining the same pixel count per millimeter could be challenging when shifting to a higher resolution camera with no image distortion, but that is achievable with proper camera lens and lighting architecture. A digital camera is used to capture and transmit images to the image controller to have them processed while the illuminator illuminates the features which get reflected to the camera. New capabilities help to address the vision challenges across densely packed components in single field of view, high-speed imaging (speed of acquisition), inspection capability, and applications involving shiny, reflective, or glossy parts. These capabilities help to capture a single image in a bigger camera FOV to process multiple features in the same region of interest (ROI). This eliminates the number of gantry moves, settle time waits, and image acquisitions to substantially reduce the vision processing time, leading to faster product throughput.
    • Download: (865.4Kb)
    • Show Full MetaData Hide Full MetaData
    • Get RIS
    • Item Order
    • Go To Publisher
    • Statistics

      Improved Productivity With High-Speed Imaging for Printed Circuit Board Applications in Electronics Assembly

    URI
    https://yetl.yabesh.ir/yetl1/handle/yetl/4316307
    Collections
    • Journal of Electronic Packaging

    Show full item record

    contributor authorAgarwal, Sunny
    date accessioned2026-08-23T08:16:17Z
    date available2026-08-23T08:16:17Z
    date copyright2026/03/01
    date issued2026
    identifier issn1043-7398
    identifier otherep-24-1111.pdf
    identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4316307
    description abstractAbstract. Machine vision inspections need to go through complex surface textures, part deviations/curvatures, nonuniform lighting, highly reflective surfaces, and unpredictable defects, which introduce image quality issues leading to serious inspection challenges. Machine vision systems struggle to appreciate part variability and deviation due to rotation, scaling, and image distortion when it comes to locating distinct features on very similar parts. All these factors combined make it difficult for vision systems to program and work efficiently. This newly offered vision package has improved camera optics with a large field of view (FOV) illumination, providing higher resolution images for better dot placement along with a reduction in cycle time. This includes advanced electronics like a higher resolution camera, better on/off-axis lighting to maintain uniform lighting across the full field of view. Maintaining the same pixel count per millimeter could be challenging when shifting to a higher resolution camera with no image distortion, but that is achievable with proper camera lens and lighting architecture. A digital camera is used to capture and transmit images to the image controller to have them processed while the illuminator illuminates the features which get reflected to the camera. New capabilities help to address the vision challenges across densely packed components in single field of view, high-speed imaging (speed of acquisition), inspection capability, and applications involving shiny, reflective, or glossy parts. These capabilities help to capture a single image in a bigger camera FOV to process multiple features in the same region of interest (ROI). This eliminates the number of gantry moves, settle time waits, and image acquisitions to substantially reduce the vision processing time, leading to faster product throughput.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleImproved Productivity With High-Speed Imaging for Printed Circuit Board Applications in Electronics Assembly
    typeJournal Paper
    journal volume148
    journal issue1
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.4069682
    journal fristpage15921
    journal lastpage15944
    page24
    treeJournal of Electronic Packaging:;2026:;volume( 148 ):;issue:001
    contenttypeFulltext
    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian
     
    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian