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    Evaluation of Length Scales and Meshing Requirements for Resolving Two-Phase Flow Regime Transitions Using the Level Set Method

    Source: Journal of Fluids Engineering:;2021:;volume( 143 ):;issue: 006::page 061403-1
    Author:
    Zimmer, Matthew D.
    ,
    Bolotnov, Igor A.
    DOI: 10.1115/1.4049934
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: New criteria for fully resolving two-phase flow regime transitions using direct numerical simulation with the level set method for interface capturing are proposed. A series of flows chosen to capture small scale interface phenomena are simulated at different grid refinements. These cases include droplet deformation and breakup in a simple shear field, the thin film around a Taylor bubble, and the rise of a bubble toward a free surface. These cases cover the major small scale phenomena observed in two-phase flows: internal recirculation, interface curvature, interface snapping, flow of liquid in thin films, and drainage/snapping of thin films. The results from these simulations and their associated grid studies were used to develop new meshing requirements for simulation of two-phase flow using interface capturing methods, in particular the level set method. When applicable, the code used in this work, PHASTA, was compared to experiments in order to contribute to the ongoing validation process of the code. Results show that when the solver meets these criteria, with the exception of resolving the nanometer scale liquid film between coalescing bubbles, the code is capable of accurately simulating interface topology changes.
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      Evaluation of Length Scales and Meshing Requirements for Resolving Two-Phase Flow Regime Transitions Using the Level Set Method

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    https://yetl.yabesh.ir/yetl1/handle/yetl/4277269
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    • Journal of Fluids Engineering

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    contributor authorZimmer, Matthew D.
    contributor authorBolotnov, Igor A.
    date accessioned2022-02-05T22:16:59Z
    date available2022-02-05T22:16:59Z
    date copyright3/4/2021 12:00:00 AM
    date issued2021
    identifier issn0098-2202
    identifier otherfe_143_06_061403.pdf
    identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4277269
    description abstractNew criteria for fully resolving two-phase flow regime transitions using direct numerical simulation with the level set method for interface capturing are proposed. A series of flows chosen to capture small scale interface phenomena are simulated at different grid refinements. These cases include droplet deformation and breakup in a simple shear field, the thin film around a Taylor bubble, and the rise of a bubble toward a free surface. These cases cover the major small scale phenomena observed in two-phase flows: internal recirculation, interface curvature, interface snapping, flow of liquid in thin films, and drainage/snapping of thin films. The results from these simulations and their associated grid studies were used to develop new meshing requirements for simulation of two-phase flow using interface capturing methods, in particular the level set method. When applicable, the code used in this work, PHASTA, was compared to experiments in order to contribute to the ongoing validation process of the code. Results show that when the solver meets these criteria, with the exception of resolving the nanometer scale liquid film between coalescing bubbles, the code is capable of accurately simulating interface topology changes.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleEvaluation of Length Scales and Meshing Requirements for Resolving Two-Phase Flow Regime Transitions Using the Level Set Method
    typeJournal Paper
    journal volume143
    journal issue6
    journal titleJournal of Fluids Engineering
    identifier doi10.1115/1.4049934
    journal fristpage061403-1
    journal lastpage061403-12
    page12
    treeJournal of Fluids Engineering:;2021:;volume( 143 ):;issue: 006
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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