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    Modeling the Probability of Freeway Rear-End Crash Occurrence

    Source: Journal of Transportation Engineering, Part A: Systems:;2007:;Volume ( 133 ):;issue: 001
    Author:
    Joon-Ki Kim
    ,
    Yinhai Wang
    ,
    Gudmundur F. Ulfarsson
    DOI: 10.1061/(ASCE)0733-947X(2007)133:1(11)
    Publisher: American Society of Civil Engineers
    Abstract: A microscopic model of freeway rear-end crash risk is developed based on a modified negative binomial regression and estimated using Washington State data. Compared with most existing models, this model has two major advantages: (1) It directly considers a driver’s response time distribution; and (2) it applies a new dual-impact structure accounting for the probability of both a vehicle becoming an obstacle
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      Modeling the Probability of Freeway Rear-End Crash Occurrence

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    https://yetl.yabesh.ir/yetl1/handle/yetl/37924
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    contributor authorJoon-Ki Kim
    contributor authorYinhai Wang
    contributor authorGudmundur F. Ulfarsson
    date accessioned2017-05-08T21:04:54Z
    date available2017-05-08T21:04:54Z
    date copyrightJanuary 2007
    date issued2007
    identifier other%28asce%290733-947x%282007%29133%3A1%2811%29.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/37924
    description abstractA microscopic model of freeway rear-end crash risk is developed based on a modified negative binomial regression and estimated using Washington State data. Compared with most existing models, this model has two major advantages: (1) It directly considers a driver’s response time distribution; and (2) it applies a new dual-impact structure accounting for the probability of both a vehicle becoming an obstacle
    publisherAmerican Society of Civil Engineers
    titleModeling the Probability of Freeway Rear-End Crash Occurrence
    typeJournal Paper
    journal volume133
    journal issue1
    journal titleJournal of Transportation Engineering, Part A: Systems
    identifier doi10.1061/(ASCE)0733-947X(2007)133:1(11)
    treeJournal of Transportation Engineering, Part A: Systems:;2007:;Volume ( 133 ):;issue: 001
    contenttypeFulltext
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